Today’s needs to stay successful in the LED market have changed dramatically over the last two years. The result of oversupply in certain areas and tight product performance specification in others, the need for early identification of process excursions, reactor control, emission wavelength and yield prediction became critical parameters to reduce cost of production.
New technologies and substrates have increased the demand for new process parameters such as wafer bow and defect density. Nanometrics comprehensive product portfolio allows customers to control critical parameters and address process problems with a very short time to results. Characterizing the performance of a LED before reaching the expensive back end process allows early product binning for predictable turnaround estimation.