One of the most important parameter to control in III-V semiconductor is the material composition to ensure desired material properties. Nanometrics product portfolio offers a comprehensive suite of systems – table top or automated – to help you controlling the properties of single layers or multiple material films. Nanometrics product range enables to gain control over your material band gap, thickness, carrier concentration, mobility and resistivity. Furthermore you are able to detect material impurities and defects which may affect the device performance. Powerful software allows your to identify, characterize and optimize critical process parameters, monitor and highlight process excursions and bin your products at early stage of the process flow.